Enter your keyword

2-s2.0-0032163109

[vc_empty_space][vc_empty_space]

An optimal double sampling X̄ control chart

Irianto D.a, Shinozaki N.b

a Dept. Industrial Engineering, Bandung Institute of Technology, Indonesia
b Dept. Administration Engineering, Keio University, Japan

[vc_row][vc_column][vc_row_inner][vc_column_inner][vc_separator css=”.vc_custom_1624529070653{padding-top: 30px !important;padding-bottom: 30px !important;}”][/vc_column_inner][/vc_row_inner][vc_row_inner layout=”boxed”][vc_column_inner width=”3/4″ css=”.vc_custom_1624695412187{border-right-width: 1px !important;border-right-color: #dddddd !important;border-right-style: solid !important;border-radius: 1px !important;}”][vc_empty_space][megatron_heading title=”Abstract” size=”size-sm” text_align=”text-left”][vc_column_text]The standard Shewhart X̄ control chart has been widely used because of its simplicity. This method, however, is slow in detecting small shifts in the process. Quick detection without increasing the false alarm rate is a desirable objective and a control chart with warning limit may be needed, for example the chart with variable sampling interval (VSI), variable sampling size (VSS) and double sampling (DS). In contrast to the first two methods, the double sampling procedure allows observation of the second sample without any interruption, and thus it comes from the same population as the first. In this study, the double sampling procedure is briefly discussed and a comparison between Daudin’s (1992) and Croasdale’s (1974) procedures is given. Instead of minimizing the expected sample size, we propose to maximize the chart’s power to detect a small shift of process mean value. In this regard, the comparative advantage of the DS procedure to VSI and VSS is also presented. Significance: This paper is aimed for a quick detection control chart without increasing false alarm rate, which is needed for a continuous flow manufacturing system that produces a high volume of products in a short lead tune.[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Author keywords” size=”size-sm” text_align=”text-left”][vc_column_text]Continuous flow manufacturing systems,Double sampling control chart,Quick detection,Variable sampling interval,Variable sampling size[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Indexed keywords” size=”size-sm” text_align=”text-left”][vc_column_text]Average sample size,Double sampling control chart,Optimization,Power of control chart,Quick detection[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Funding details” size=”size-sm” text_align=”text-left”][vc_column_text][/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”DOI” size=”size-sm” text_align=”text-left”][vc_column_text][/vc_column_text][/vc_column_inner][vc_column_inner width=”1/4″][vc_column_text]Widget Plumx[/vc_column_text][/vc_column_inner][/vc_row_inner][/vc_column][/vc_row][vc_row][vc_column][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][/vc_column][/vc_row]