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Structural and optical properties analysis of MoS2 nanoflakes on quartz substrate as prepared by mechanical exfoliation
Adilla S.J.a, Nurfani E.a, Kurniawan R.a, Satrya C.D.a, Darma Y.a
a Quantum Semiconductor and Devices Laboratory, Department of Physics, Bandung Institute of Technology, Bandung, 40132, Indonesia
[vc_row][vc_column][vc_row_inner][vc_column_inner][vc_separator css=”.vc_custom_1624529070653{padding-top: 30px !important;padding-bottom: 30px !important;}”][/vc_column_inner][/vc_row_inner][vc_row_inner layout=”boxed”][vc_column_inner width=”3/4″ css=”.vc_custom_1624695412187{border-right-width: 1px !important;border-right-color: #dddddd !important;border-right-style: solid !important;border-radius: 1px !important;}”][vc_empty_space][megatron_heading title=”Abstract” size=”size-sm” text_align=”text-left”][vc_column_text]© Published under licence by IOP Publishing Ltd.We study the structural and optical properties of MoS2 nanoflakes on quartz substrate as prepared by mechanical exfoliation method. The structural and morphological properties of MoS2 nanoflakes were characterized by SEM, EDS, and XRD, while the high-resolution spectroscopic ellipsometry (SE) with the photon energy of 1.27 to 6.53 eV is used to study its optical characteristics. As the results, SEM data shows that MoS2 appears to be nanoflakes covering around 25-35% on the surface of quartz substrate, and XRD spectra shows the dominant orientation along c-axis (002). Based on spectroscopic ellipsometry analysis, the average thickness of MoS2 nanoflakes is around 12 nm or about 6-8 layers. By using Tauc plot method, we confirm that MoS2 nanoflakes have a semiconductor characteristic with the optical bandgap as high as 1.68 eV. Our study shows the important of structural and optical properties of MoS2 nanoflakes that can be utilized for future optoelectronic devices and energy-harvesting purposes.[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Author keywords” size=”size-sm” text_align=”text-left”][vc_column_text]Dominant orientation,High resolution,Mechanical exfoliation,Optical characteristics,Photon energy,Quartz substrate,Structural and morphological properties,Structural and optical properties[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Indexed keywords” size=”size-sm” text_align=”text-left”][vc_column_text][/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Funding details” size=”size-sm” text_align=”text-left”][vc_column_text]This work is partly supported by Riset Kompetensi (586n/I1.C01/PL/2016) by Kemenristek DIKTI 2016 program and RUPT 2016 from Indonesian government. We also thanks to SSLS-NUS Singapore for SE measurement facility.[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”DOI” size=”size-sm” text_align=”text-left”][vc_column_text]https://doi.org/10.1088/1742-6596/877/1/012036[/vc_column_text][/vc_column_inner][vc_column_inner width=”1/4″][vc_column_text]Widget Plumx[/vc_column_text][/vc_column_inner][/vc_row_inner][/vc_column][/vc_row][vc_row][vc_column][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][/vc_column][/vc_row]