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The effect of the grounding condition of line impedance stabilization network on the measurement validity of conducted emission parameter
Ananda W.a, Cahyadi S.A.a, Inayaturohman I.a, Hamdani D.b
a Center for Material and Technical Product (B4T), Ministry of Industry, Bandung, West Java, Indonesia
b School of Electrical Engineering and Informatics, Bandung Institute of Technology, Bandung, West Java, Indonesia
[vc_row][vc_column][vc_row_inner][vc_column_inner][vc_separator css=”.vc_custom_1624529070653{padding-top: 30px !important;padding-bottom: 30px !important;}”][/vc_column_inner][/vc_row_inner][vc_row_inner layout=”boxed”][vc_column_inner width=”3/4″ css=”.vc_custom_1624695412187{border-right-width: 1px !important;border-right-color: #dddddd !important;border-right-style: solid !important;border-radius: 1px !important;}”][vc_empty_space][megatron_heading title=”Abstract” size=”size-sm” text_align=”text-left”][vc_column_text]© 2017 IEEE.Line impedance stabilization network (LISN) is an important tool to provide noiseless power supply in electromagnetic compatibility (EMC) testing. There are several brands of LISN that are recognized in the market. However, the quality of measurement provided by the LISN is not dependent upon the quality of the product, but also its application scheme. This paper investigates the effect of grounding condition of LISN on the validity of measurement of conducted emission parameter. The test method used refers to CISPR 13:2009. The measurement showed that the grounding condition of LISN introduced the difference of the highest quasi-peak value of 1.24 dB in a no-load condition and 2.96 dB when using television as a load.[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Author keywords” size=”size-sm” text_align=”text-left”][vc_column_text]Conducted emissions,Electromagnetic compatibility (EMC) testing,Grounding conditions,ITS applications,Line impedance stabilization networks,No-load conditions,Power supply,Test method[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Indexed keywords” size=”size-sm” text_align=”text-left”][vc_column_text]Conducted emission (CE),Electromagnetic compatibility (EMC),Line impedance stabilization network (LISN)[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Funding details” size=”size-sm” text_align=”text-left”][vc_column_text][/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”DOI” size=”size-sm” text_align=”text-left”][vc_column_text]https://doi.org/10.1109/ICHVEPS.2017.8225898[/vc_column_text][/vc_column_inner][vc_column_inner width=”1/4″][vc_column_text]Widget Plumx[/vc_column_text][/vc_column_inner][/vc_row_inner][/vc_column][/vc_row][vc_row][vc_column][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][/vc_column][/vc_row]