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Origin of fast-response photocurrent in ZnO thin film
Nurfani E.a, Purbayanto M.A.K.a, Aono T., Takase K., Darma Y.a
a Department of Physics, Faculty of Mathematics and Natural Sciences, Institut Teknologi Bandung, Bandung, 40132, Indonesia
b College of Science and Technology, Nihon University, Tokyo, 101-0062, Japan
[vc_row][vc_column][vc_row_inner][vc_column_inner][vc_separator css=”.vc_custom_1624529070653{padding-top: 30px !important;padding-bottom: 30px !important;}”][/vc_column_inner][/vc_row_inner][vc_row_inner layout=”boxed”][vc_column_inner width=”3/4″ css=”.vc_custom_1624695412187{border-right-width: 1px !important;border-right-color: #dddddd !important;border-right-style: solid !important;border-radius: 1px !important;}”][vc_empty_space][megatron_heading title=”Abstract” size=”size-sm” text_align=”text-left”][vc_column_text]© 2018 Elsevier B.V.We study the origin of fast-response photocurrent in ZnO system grown by dc-unbalanced magnetron sputtering. Current-voltage (I-V) measurements show that ZnO thin film is sensitive to UV–visible wavelength and the response time is about 5 ms. This typical sensitivity is related to the contribution of native point defects in electrical transport, as indicated by a space-charge-limited current regime. I-V curves in vacuum, Ar, and O2 environments reveal that oxygen vacancies (VO) play an important role in adsorption and desorption processes. Using absorption and temperature-dependent photoluminescence spectroscopy, the presence of VO is confirmed and dominates even at low temperature. The strong contribution of VO promotes low excitonic absorption, resulting in low photocurrent and fast-response detector. We propose that fast-response ZnO photodetector is not only originated from Schottky barrier but also from VO-related defect states. This result is important to improve the functionalities of ZnO for optoelectronic applications.[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Author keywords” size=”size-sm” text_align=”text-left”][vc_column_text]Adsorption and desorptions,Current-voltage measurements,Fast response,Optoelectronic applications,Space charge limited current regimes,Temperature-dependent photoluminescence spectroscopies,Unbalanced magnetron sputtering,ZnO thin film[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Indexed keywords” size=”size-sm” text_align=”text-left”][vc_column_text]Defects,Fast response,Photodetector,ZnO thin film[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Funding details” size=”size-sm” text_align=”text-left”][vc_column_text][/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”DOI” size=”size-sm” text_align=”text-left”][vc_column_text]https://doi.org/10.1016/j.optmat.2018.07.040[/vc_column_text][/vc_column_inner][vc_column_inner width=”1/4″][vc_column_text]Widget Plumx[/vc_column_text][/vc_column_inner][/vc_row_inner][/vc_column][/vc_row][vc_row][vc_column][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][/vc_column][/vc_row]