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Dielectric relaxation in YMnO3 single crystals
Adem U.a,b, Mufti N.a,c, Nugroho A.A.a,d, Catalan G.e,f, Noheda B.a, Palstra T.T.M.a
a Zernike Institute for Advanced Materials, University of Groningen, AG Groningen, 9747, Netherlands
b Department of Engineering Physics, Faculty of Engineering, Ankara University, Besevler, Ankara, 06100, Turkey
c Department of Physics, State University of Malang, Malang, 65145, Indonesia
d Faculty of Mathematics and Natural Sciences, Institut Teknologi Bandung, Bandung, 40132, Indonesia
e ICREA – Institucio Catalana de Recerca i Estudis Avançats, Barcelona, 08010, Spain
f ICN2 – Institut Catala de Nanociencia i Nanotecnologia, Campus UAB, Bellaterra, Barcelona, 08193, Spain
[vc_row][vc_column][vc_row_inner][vc_column_inner][vc_separator css=”.vc_custom_1624529070653{padding-top: 30px !important;padding-bottom: 30px !important;}”][/vc_column_inner][/vc_row_inner][vc_row_inner layout=”boxed”][vc_column_inner width=”3/4″ css=”.vc_custom_1624695412187{border-right-width: 1px !important;border-right-color: #dddddd !important;border-right-style: solid !important;border-radius: 1px !important;}”][vc_empty_space][megatron_heading title=”Abstract” size=”size-sm” text_align=”text-left”][vc_column_text]© 2015 Elsevier B.V. All rights reserved.We have investigated the origin of the dielectric relaxation in YMnO3 single crystals. Two distinct dielectric relaxation features were observed at low (200≤T≤373K) and high (300≤T≤450K) temperatures. Analysis of our detailed frequency, electrode and thickness dependent dielectric measurements and ac conductivity data as well as the use of single crystals allow us to get a comprehensive picture of these relaxations. The low temperature relaxation is attributed to the Maxwell-Wagner type effects originating from the dipoles at the surface while the high temperature one is suggested to originate from hopping of charge carriers resulting from the second ionization of oxygen vacancies.[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Author keywords” size=”size-sm” text_align=”text-left”][vc_column_text]Ac Conductivity,Dielectric measurements,High temperature,Low temperature relaxation,Multiferroics,Second ionization,YMnO3[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Indexed keywords” size=”size-sm” text_align=”text-left”][vc_column_text]Dielectric relaxation,Multiferroics,YMnO3[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Funding details” size=”size-sm” text_align=”text-left”][vc_column_text]This work was supported by the ’Stichting voor Fundamenteel Onderzoek der Materie’ (FOM). U.A. also acknowledges the financial support of TUBITAK via 2232 Program.[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”DOI” size=”size-sm” text_align=”text-left”][vc_column_text]https://doi.org/10.1016/j.jallcom.2015.02.207[/vc_column_text][/vc_column_inner][vc_column_inner width=”1/4″][vc_column_text]Widget Plumx[/vc_column_text][/vc_column_inner][/vc_row_inner][/vc_column][/vc_row][vc_row][vc_column][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][/vc_column][/vc_row]