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A simple microcontroller-based current electrometer made from LOG112 and C8051F006 for measuring current in metal-oxide-semiconductor devices
Khairurrijala, Abdullah M.a, Suhendi A.a, Munir M.M.a,b, Surachman A.a
a Physics of Electronic Materials Research Division, Faculty of Mathematics and Natural Sciences, Institut Teknologi Bandung, Indonesia
b Department of Chemical Engineering, Hiroshima University, Japan
[vc_row][vc_column][vc_row_inner][vc_column_inner][vc_separator css=”.vc_custom_1624529070653{padding-top: 30px !important;padding-bottom: 30px !important;}”][/vc_column_inner][/vc_row_inner][vc_row_inner layout=”boxed”][vc_column_inner width=”3/4″ css=”.vc_custom_1624695412187{border-right-width: 1px !important;border-right-color: #dddddd !important;border-right-style: solid !important;border-radius: 1px !important;}”][vc_empty_space][megatron_heading title=”Abstract” size=”size-sm” text_align=”text-left”][vc_column_text]A microcontroller-based current electrometer built from LOG112 and C8051F006 system-on-a-chip has been developed for measuring current flowing through a MOS (metal-oxide-semiconductor) device. The Fluke 5100B series calibrator and a computer have been used to calibrate the electrometer. In order to examine the performance of the electrometer, Al|SrTiO3|Si and BS250 MOSFET-based MOS devices have been employed as devices under test and the Keithley 617 Programmable Electrometer has been applied as a reference. It has been found that the currents measured by the Keithley 617 Programmable Electrometer were reproduced very well by the developed electrometer. © 2007 IOP Publishing Ltd.[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Author keywords” size=”size-sm” text_align=”text-left”][vc_column_text]Logarithmic amplifier,System-on-a-chip[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Indexed keywords” size=”size-sm” text_align=”text-left”][vc_column_text]Electrometer,I-V characteristics,Logarithmic amplifier,Microcontroller,MOS device,System-on-a-chip[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Funding details” size=”size-sm” text_align=”text-left”][vc_column_text][/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”DOI” size=”size-sm” text_align=”text-left”][vc_column_text]https://doi.org/10.1088/0957-0233/18/9/037[/vc_column_text][/vc_column_inner][vc_column_inner width=”1/4″][vc_column_text]Widget Plumx[/vc_column_text][/vc_column_inner][/vc_row_inner][/vc_column][/vc_row][vc_row][vc_column][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][/vc_column][/vc_row]