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A simple and inexpensive C-V characterization system for electronics course at undergraduate level
Rahmawati E.b, Ekawita R.c, Abdullah M.a, Khairurrijala
a Physics of Electronic Materials Research Division, Faculty of Mathematics and Natural Sciences, Institut Teknologi Bandung, Indonesia
b Physics Department, Faculty of Mathematics and Natural Sciences, Universitas Negeri Surabaya, Indonesia
c Physics Department, Faculty of Mathematics and Natural Sciences, Universitas Bengkulu, Indonesia
[vc_row][vc_column][vc_row_inner][vc_column_inner][vc_separator css=”.vc_custom_1624529070653{padding-top: 30px !important;padding-bottom: 30px !important;}”][/vc_column_inner][/vc_row_inner][vc_row_inner layout=”boxed”][vc_column_inner width=”3/4″ css=”.vc_custom_1624695412187{border-right-width: 1px !important;border-right-color: #dddddd !important;border-right-style: solid !important;border-radius: 1px !important;}”][vc_empty_space][megatron_heading title=”Abstract” size=”size-sm” text_align=”text-left”][vc_column_text]A simple and inexpensive capacitance-voltage (C-V) meter based on C8051F006 SoC has been developed for characterizing electronic components. It can be a tool in laboratory to strengthen concepts delivered in lectures and also make students familiar with the characteristic equation of electronics components. The instrumentation design of C-V meter consist of a voltage source generated by DAC and voltage step source applied to device under test (DUT) and its capacitance, which is measured by C-V meter, are stored into computer via an RS-232 serial communication. The C-V meter calibrated for each part and tested for measuring C-V characteristics of capacitor and diodes. The result of the measurement is a curve characterization of C-V. The curves have been compared to the theory as qualitative.[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Author keywords” size=”size-sm” text_align=”text-left”][vc_column_text]C-V characteristic,C-V characterization,Capacitance voltage,Characteristic equation,Charge amplifiers,Device under test,Electronic component,Electronics components,Electronics course,Serial communications,Voltage source,Voltage step[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Indexed keywords” size=”size-sm” text_align=”text-left”][vc_column_text]C-V characteristic,C-V meter,Feedback charge amplifier[/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”Funding details” size=”size-sm” text_align=”text-left”][vc_column_text][/vc_column_text][vc_empty_space][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][vc_empty_space][megatron_heading title=”DOI” size=”size-sm” text_align=”text-left”][vc_column_text]https://doi.org/10.1109/ICICI-BME.2009.5417215[/vc_column_text][/vc_column_inner][vc_column_inner width=”1/4″][vc_column_text]Widget Plumx[/vc_column_text][/vc_column_inner][/vc_row_inner][/vc_column][/vc_row][vc_row][vc_column][vc_separator css=”.vc_custom_1624528584150{padding-top: 25px !important;padding-bottom: 25px !important;}”][/vc_column][/vc_row]